[1] |
韩荣典,叶邦角,翁惠民,等. 慢正电子束技术的应用与发展[J]. 物理学进展, 1999, 19(3): 305-330.HAN Rongdian, YE Bangjiao, WENG Huimin, et al. Application and development of slow positron technique[J]. Progress in Physics, 1999, 19(3): 305-330.
|
[2] |
SCHULTZ PETER J, LYNN K G. Interaction of positron beams with surfaces, thin films, and interfaces[J]. Rev Mod Phys, 1988, 60(3): 701-779.
|
[3] |
BENTABET A, BOUARISSA N.Positron backscattering from an Al target: Analytical calculation and Monte Carlo simulation[J]. Surf Interface Anal, 2007, 39(5): 377-380.
|
[4] |
COLEMAN P G, BAKER J A, CHILTON N B. Experimental studies of positron stopping inmatter: The binary sample method[J]. J Phys: Condens Matter, 1993, 5(43): 8117-8128.
|
[5] |
ASOKA-KUMAR P, LYNN K G. Implantation profile of low-energy positrons in solids[J]. Appl Phys Lett, 1990, 57(16): 1634-1636.
|
[6] |
VALKEALAHTI S, NIEMINEN R M.Monte-Carlo calculations of keV electron and positron slowing down in solids[J]. Appl Phys A, 1983, 32(2): 95-106.
|
[7] |
VALKEALAHTI S, NIEMINEN R M. Monte-Carlo calculations of keV electron and positron slowing down in solids. Ⅱ[J]. Appl Phys A, 1984, 35(1): 51-59.
|
[8] |
SELIGERH H. The backscattering of positrons and electrons[J]. Phys Rev, 1952, 88(2): 408-412.
|
[9] |
BENTABET A, FENINECHE N E.Backscattering coefficients for low energy electrons and positrons impinging on metallic thin lms: Scaling study[J]. Appl Phys A, 2009, 97: 425-430.
|
[10] |
MASSOUMI G R, LENNARD W N, SCHULTZ P J, et al. Electron and positron backscattering in the medium-energy range[J]. Phys Rev B, 1993, 47(17): 11007-11018.
|
[11] |
MASSOUMI G R, HOZHABRI N, JENSEN K O, et al.Positron and electron backscattering from solids[J]. Phys Rev Lett, 1992, 68(26): 3873-3876.
|
[12] |
BAKER J A, CHILTON N B, JENSEN K O, et al.Material dependence of positron implantation depths[J]. Appl Phys Lett, 1991, 59(23): 2962-2964.
|
[13] |
AYD1N A. Monte-Carlo calculations of positron implantation profiles in silver and gold[J]. Radiat Phys Chem, 2000, 59(3): 277-280.
|
[14] |
RITLEY K A, LYNN K G, GHOSH V J, et al. Low-energy contributions to positron implantation[J]. J Appl Phys, 1993, 74(5): 3479-3496.
|
[15] |
ALI E S M, ROGERS D W O. Benchmarking EGSnrc in the kilovoltage energy range against experimental measurements of charged particle backscatter coefficients[J]. Phys Med Biol, 2008, 53(6): 1527-1543.
|
[16] |
ALI E S M, ROGERS D W O.Energy spectra and angular distributions of charged particles backscattered from solid targets[J]. J Phys D: Appl Phys, 2008, 41(5): 055505.
|
[17] |
DRYZEK J, HORODEKP. GEANT4 simulation of slow positron beam implantation proles[J]. Nucl Instrum Method Phys Res B: Beam Interactions with Materials and Atoms, 2008, 266(18): 4000-4009.
|
[18] |
DRYZEK J, SIEMEK K.The “accumulation effect” of positrons in the stack of foils, detected by measurements of the positron implantation profile[J]. J Appl Phys, 2013, 114(22): 224901.
|
[19] |
NING Xia, CAO Xingzhong, LI Chong, et al.Modication of source contribution in PALS by simulation using Geant4 code[J]. Nucl Instrum Method Phys Res B: Beam Interactions with Materials and Atoms, 2017, 397:75-81.
|
[20] |
BENTABET A, FENINECHE N E, LOUCIF K.A comparative study between slow electrons and positrons transport in solid thin lms[J]. Appl Surf Sci, 2009, 255:7580-7585.
|
[21] |
GLAZOV L G,PZSIT I. Applications of invariant embedding: Positron backscattering from surfaces[J]. Nucl Instrum Method Phys Res B, 2004, 215(3-4): 509-524.
|
[22] |
MASSOUMI G R, HOZHABRI N, LENNARD W N, et al. Doubly differential positron-backscattering yields[J]. Phys Rev B, 1991, 44(7): 3486-3489.
|
[23] |
COLEMAN P G, ALBRECHT L, JENSEN K O, et al. Positron backscattering from elemental solids[J]. J Phys: Condes Matter, 1992, 4(50): 10311-10322.
|
[24] |
BAKER J A, COLEMAN P G. Measurement of coefficients for the back-scattering of 0.5-30 keV positrons from metallic surfaces[J]. J Phys C: Solid State Phys, 1988, 21(23): L875-L880.
|
[25] |
BAKER J A, CHILTON N B, JENSEN K O, et al. Median penetration depths and implantation profiles for low energy positrons in Al[J]. J Phys: Condens Matter, 1991, 3(22): 4109-4114.
|
[26] |
MAKINEN J, PALKO S, MARTIKAINEN J, et al.Positron backscattering probabilities from solid surfaces at 2-30 keV[J]. J Phys: Condens Matter, 1992, 4(36): L503-L508.
|
[27] |
BAKER J A, CHILTON N B, COLEMAN P G.Stopping of 10-50 keV positrons in aluminum[J]. Appl Phys Lett, 1991, 59(2):164-166.
|
[28] |
AGOSTINELLI S, ALLISON J, AMAKO K, et al.Geant4: A simulation toolkit[J]. Nucl Instrum Method Phys Res A, 2003, 506(3): 250-303.
|
[29] |
HUANG Shijuan, PAN Ziwen, LIU Jiandang, et al. Simulation of positron backscattering and implantation proles using Geant4 code[J]. Chin Phys B, 2015, 24(10):107803.
|
[30] |
LAI Xin, JIANG Xiaopan, CAO Xingzhong, et al. Simulation of positron backscattering on Al, Cu, Ag and Au targets using GEANT4 code[J]. Surf Interface Anal, 2016, 49(5):457-463.
|
[31] |
CHAOUI Z, BOUARISSA N.Positron and electron backscattering from elemental solids in the 1-10 keV energy range[J]. J Phys: Condens Matter, 2004, 16(6):799-808.
|
[1] |
韩荣典,叶邦角,翁惠民,等. 慢正电子束技术的应用与发展[J]. 物理学进展, 1999, 19(3): 305-330.HAN Rongdian, YE Bangjiao, WENG Huimin, et al. Application and development of slow positron technique[J]. Progress in Physics, 1999, 19(3): 305-330.
|
[2] |
SCHULTZ PETER J, LYNN K G. Interaction of positron beams with surfaces, thin films, and interfaces[J]. Rev Mod Phys, 1988, 60(3): 701-779.
|
[3] |
BENTABET A, BOUARISSA N.Positron backscattering from an Al target: Analytical calculation and Monte Carlo simulation[J]. Surf Interface Anal, 2007, 39(5): 377-380.
|
[4] |
COLEMAN P G, BAKER J A, CHILTON N B. Experimental studies of positron stopping inmatter: The binary sample method[J]. J Phys: Condens Matter, 1993, 5(43): 8117-8128.
|
[5] |
ASOKA-KUMAR P, LYNN K G. Implantation profile of low-energy positrons in solids[J]. Appl Phys Lett, 1990, 57(16): 1634-1636.
|
[6] |
VALKEALAHTI S, NIEMINEN R M.Monte-Carlo calculations of keV electron and positron slowing down in solids[J]. Appl Phys A, 1983, 32(2): 95-106.
|
[7] |
VALKEALAHTI S, NIEMINEN R M. Monte-Carlo calculations of keV electron and positron slowing down in solids. Ⅱ[J]. Appl Phys A, 1984, 35(1): 51-59.
|
[8] |
SELIGERH H. The backscattering of positrons and electrons[J]. Phys Rev, 1952, 88(2): 408-412.
|
[9] |
BENTABET A, FENINECHE N E.Backscattering coefficients for low energy electrons and positrons impinging on metallic thin lms: Scaling study[J]. Appl Phys A, 2009, 97: 425-430.
|
[10] |
MASSOUMI G R, LENNARD W N, SCHULTZ P J, et al. Electron and positron backscattering in the medium-energy range[J]. Phys Rev B, 1993, 47(17): 11007-11018.
|
[11] |
MASSOUMI G R, HOZHABRI N, JENSEN K O, et al.Positron and electron backscattering from solids[J]. Phys Rev Lett, 1992, 68(26): 3873-3876.
|
[12] |
BAKER J A, CHILTON N B, JENSEN K O, et al.Material dependence of positron implantation depths[J]. Appl Phys Lett, 1991, 59(23): 2962-2964.
|
[13] |
AYD1N A. Monte-Carlo calculations of positron implantation profiles in silver and gold[J]. Radiat Phys Chem, 2000, 59(3): 277-280.
|
[14] |
RITLEY K A, LYNN K G, GHOSH V J, et al. Low-energy contributions to positron implantation[J]. J Appl Phys, 1993, 74(5): 3479-3496.
|
[15] |
ALI E S M, ROGERS D W O. Benchmarking EGSnrc in the kilovoltage energy range against experimental measurements of charged particle backscatter coefficients[J]. Phys Med Biol, 2008, 53(6): 1527-1543.
|
[16] |
ALI E S M, ROGERS D W O.Energy spectra and angular distributions of charged particles backscattered from solid targets[J]. J Phys D: Appl Phys, 2008, 41(5): 055505.
|
[17] |
DRYZEK J, HORODEKP. GEANT4 simulation of slow positron beam implantation proles[J]. Nucl Instrum Method Phys Res B: Beam Interactions with Materials and Atoms, 2008, 266(18): 4000-4009.
|
[18] |
DRYZEK J, SIEMEK K.The “accumulation effect” of positrons in the stack of foils, detected by measurements of the positron implantation profile[J]. J Appl Phys, 2013, 114(22): 224901.
|
[19] |
NING Xia, CAO Xingzhong, LI Chong, et al.Modication of source contribution in PALS by simulation using Geant4 code[J]. Nucl Instrum Method Phys Res B: Beam Interactions with Materials and Atoms, 2017, 397:75-81.
|
[20] |
BENTABET A, FENINECHE N E, LOUCIF K.A comparative study between slow electrons and positrons transport in solid thin lms[J]. Appl Surf Sci, 2009, 255:7580-7585.
|
[21] |
GLAZOV L G,PZSIT I. Applications of invariant embedding: Positron backscattering from surfaces[J]. Nucl Instrum Method Phys Res B, 2004, 215(3-4): 509-524.
|
[22] |
MASSOUMI G R, HOZHABRI N, LENNARD W N, et al. Doubly differential positron-backscattering yields[J]. Phys Rev B, 1991, 44(7): 3486-3489.
|
[23] |
COLEMAN P G, ALBRECHT L, JENSEN K O, et al. Positron backscattering from elemental solids[J]. J Phys: Condes Matter, 1992, 4(50): 10311-10322.
|
[24] |
BAKER J A, COLEMAN P G. Measurement of coefficients for the back-scattering of 0.5-30 keV positrons from metallic surfaces[J]. J Phys C: Solid State Phys, 1988, 21(23): L875-L880.
|
[25] |
BAKER J A, CHILTON N B, JENSEN K O, et al. Median penetration depths and implantation profiles for low energy positrons in Al[J]. J Phys: Condens Matter, 1991, 3(22): 4109-4114.
|
[26] |
MAKINEN J, PALKO S, MARTIKAINEN J, et al.Positron backscattering probabilities from solid surfaces at 2-30 keV[J]. J Phys: Condens Matter, 1992, 4(36): L503-L508.
|
[27] |
BAKER J A, CHILTON N B, COLEMAN P G.Stopping of 10-50 keV positrons in aluminum[J]. Appl Phys Lett, 1991, 59(2):164-166.
|
[28] |
AGOSTINELLI S, ALLISON J, AMAKO K, et al.Geant4: A simulation toolkit[J]. Nucl Instrum Method Phys Res A, 2003, 506(3): 250-303.
|
[29] |
HUANG Shijuan, PAN Ziwen, LIU Jiandang, et al. Simulation of positron backscattering and implantation proles using Geant4 code[J]. Chin Phys B, 2015, 24(10):107803.
|
[30] |
LAI Xin, JIANG Xiaopan, CAO Xingzhong, et al. Simulation of positron backscattering on Al, Cu, Ag and Au targets using GEANT4 code[J]. Surf Interface Anal, 2016, 49(5):457-463.
|
[31] |
CHAOUI Z, BOUARISSA N.Positron and electron backscattering from elemental solids in the 1-10 keV energy range[J]. J Phys: Condens Matter, 2004, 16(6):799-808.
|